Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6681352 | Method for testing damaged integrated circuits | — | 2004-01-20 |
| 6420885 | System and apparatus for low-temperature semiconductor device testing | — | 2002-07-16 |
| 6292003 | Apparatus and method for testing chip scale package integrated circuits | Eric D. Hornchek | 2001-09-18 |
| 6292006 | Method for preventing condensation on handler board during semiconductor device testing | — | 2001-09-18 |
| 6118286 | Semiconductor device tester-to-handler Interface board with large test area | — | 2000-09-12 |
| 5952839 | Method and apparatus for a pin-configurable integrated circuit tester board | — | 1999-09-14 |
| 5945837 | Interface structure for an integrated circuit device tester | — | 1999-08-31 |
| 5936415 | Method and apparatus for a pin-configurable integrated circuit tester board | — | 1999-08-10 |
| 5907245 | System and method for testing integrated circuits in dry atmosphere | — | 1999-05-25 |
| 5705932 | System for expanding space provided by test computer to test multiple integrated circuits simultaneously | — | 1998-01-06 |