Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6461879 | Method and apparatus for measuring effects of packaging stresses of common IC electrical performance parameters at wafer sort | Richard C. Blish, II | 2002-10-08 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6461879 | Method and apparatus for measuring effects of packaging stresses of common IC electrical performance parameters at wafer sort | Richard C. Blish, II | 2002-10-08 |