Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8468408 | Memory built-in self test (MBIST) circuitry configured to facilitate production of pre-stressed integrated circuits and methods | Wei-Yu Chen, Kevin Badgett | 2013-06-18 |
| 8423846 | Integrated circuit with memory built-in self test (MBIST) circuitry having enhanced features and methods | Wei-Yu Chen, Kevin Badgett | 2013-04-16 |