Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6319737 | Method and apparatus for characterizing a semiconductor device | Gary Putnam, Jennifer CHENG | 2001-11-20 |
| 6240329 | Method and apparatus for a semiconductor wafer inspection system using a knowledge-based system | — | 2001-05-29 |
| 6162684 | Ammonia annealed and wet oxidized LPCVD oxide to replace ono films for high integrated flash memory devices | Kent Kuohua Chang, David Chi | 2000-12-19 |
| 6074917 | LPCVD oxide and RTA for top oxide of ONO film to improve reliability for flash memory devices | Kent Kuohua Chang, David Chi | 2000-06-13 |