Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10393794 | Method for enhancing stability, robustness and throughput of semiconductor device test machines in low temperature conditions | Kun-Jung Kuo | 2019-08-27 |
| 10126352 | Method for enhancing stability, robustness and throughput of semiconductor device test machines in low temperature conditions | Kun-Jung Kuo | 2018-11-13 |