Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8732528 | Measuring test effects using adjusted outlier data | Zhuo Zhang, Harry J. Paarsch, Patrick Ludvig Bajari, Sameer R. Rajyaguru, Ivan Eduardo Gonzalez | 2014-05-20 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8732528 | Measuring test effects using adjusted outlier data | Zhuo Zhang, Harry J. Paarsch, Patrick Ludvig Bajari, Sameer R. Rajyaguru, Ivan Eduardo Gonzalez | 2014-05-20 |