Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10684128 | Batch and continuous methods for evaluating the physical and thermal properties of films | Bhushan L. Sopori, Michael J. Ulsh, Guido Bender, Michael Penev, Jianlin Li +2 more | 2020-06-16 |
| 10480935 | Thickness mapping using multispectral imaging | Michael J. Ulsh | 2019-11-19 |
| 9234843 | On-line, continuous monitoring in solar cell and fuel cell manufacturing using spectral reflectance imaging | Bhushan L. Sopori, Michael J. Ulsh | 2016-01-12 |
| 8780343 | Wafer screening device and methods for wafer screening | Bhushan L. Sopori | 2014-07-15 |