| 11967650 |
Snapback electrostatic discharge protection device with tunable parameters |
Sagar Saxena, Maxim Klebanov, Chung C. Kuo, Sebastian Courtney, Sundar Chetlur |
2024-04-23 |
| 11303116 |
Methods and apparatus for electrical overstress protection |
Maxim Klebanov, Sundar Chetlur |
2022-04-12 |
| 11195826 |
Electrostatic discharge protection |
Maxim Klebanov, Sagar Saxena, Chung C. Kuo, Sebastian Courtney, Sundar Chetlur |
2021-12-07 |
| 10943976 |
Metal-oxide semiconductor (MOS) device structure based on a poly-filled trench isolation region |
Sundar Chetlur, Maxim Klebanov |
2021-03-09 |
| 10649481 |
Output driver having reduced electromagnetic susceptibility and associated methods |
Richard B. Cooper, Maxim Klebanov, Devon Fernandez |
2020-05-12 |
| 10608430 |
Switched electrical overstress protection |
Maxim Klebanov |
2020-03-31 |
| 10468485 |
Metal-oxide semiconductor (MOS) device structure based on a poly-filled trench isolation region |
Sundar Chetlur, Maxim Klebanov |
2019-11-05 |
| 10256225 |
Gate-less electrostatic discharge systems and methods for forming |
Maxim Klebanov |
2019-04-09 |
| 10234887 |
Output driver having reduced electromagnetic susceptibility and associated methods |
Richard B. Cooper, Maxim Klebanov, Devon Fernandez |
2019-03-19 |
| 10147689 |
Multi-die integrated circuit device with capacitive overvoltage protection |
Maxim Klebanov |
2018-12-04 |
| 10145904 |
Multi-die integrated circuit device with overvoltage protection |
Maxim Klebanov, William P. Taylor |
2018-12-04 |
| 10147688 |
Integrated circuit device with overvoltage discharge protection |
William Wilkinson, Maxim Klebanov |
2018-12-04 |
| 10056364 |
Electronic device with adjustable reverse breakdown voltage |
Maxim Klebanov, Richard B. Cooper, Chung C. Kuo |
2018-08-21 |
| 9941224 |
Multi-die integrated circuit device with capacitive overvoltage protection |
Maxim Klebanov |
2018-04-10 |
| 9866014 |
Electronic device with shared EOS protection and power interruption mitigation |
Maxim Klebanov |
2018-01-09 |
| 8922962 |
Method and apparatus to improve ESD robustness of power clamps |
Maxim Klebanov |
2014-12-30 |
| 7694200 |
Integrated circuit having built-in self-test features |
Glenn A. Forrest |
2010-04-06 |
| 7253614 |
Proximity detector having a sequential flow state machine |
Glenn A. Forrest, James M. Bailey |
2007-08-07 |