SG

Sergey GREBENKIN

AT Align Technology: 9 patents #139 of 483Top 30%
NV NVIDIA: 2 patents #2,855 of 7,811Top 40%
Overall (All Time): #437,102 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12419725 Molar trimming prediction and validation using machine learning Roman A. Roschin, Evgenii Vladimirovich Karnygin, Dmitry GUSKOV, Dmitrii ISCHEYKIN, Ivan POTAPENKO +12 more 2025-09-23
12329599 Detection of missing or ectopic teeth Roman A. Roschin, Evgenii Vladimirovich Karnygin, Alexey LAZAREV, Dmitry GUSKOV, Ivan SLEPYNIN +3 more 2025-06-17
12138137 Segmentation quality assessment Roman A. Roschin, Evgenii Vladimirovich Karnygin, Dmitry GUSKOV, Dmitrii ISCHEYKIN, Ivan POTAPENKO +8 more 2024-11-12
12036093 Molar trimming prediction and validation using machine learning Roman A. Roschin, Evgenii Vladimirovich Karnygin, Dmitry GUSKOV, Dmitrii ISCHEYKIN, Ivan POTAPENKO +12 more 2024-07-16
11903793 Machine learning dental segmentation methods using sparse voxel representations Christopher E. Cramer, Roman GUDCHENKO, Dmitrii ISCHEYKIN, Vasily PARAKETSOV, Denis DURDIN +11 more 2024-02-20
11751974 Automatic ectopic teeth detection on scan Roman A. Roschin, Evgenii Vladimirovich Karnygin, Alexey LAZAREV, Dmitry GUSKOV, Ivan SLEPYNIN +3 more 2023-09-12
11707344 Segmentation quality assessment Roman A. Roschin, Evgenii Vladimirovich Karnygin, Dmitry GUSKOV, Dmitrii ISCHEYKIN, Ivan POTAPENKO +8 more 2023-07-25
11654001 Molar trimming prediction and validation using machine learning Roman A. Roschin, Evgenii Vladimirovich Karnygin, Dmitry GUSKOV, Dmitrii ISCHEYKIN, Ivan POTAPENKO +12 more 2023-05-23
11154381 Automatic ectopic teeth detection on scan Roman A. Roschin, Evgenii Vladimirovich Karnygin, Alexey LAZAREV, Dmitry GUSKOV, Ivan SLEPYNIN +3 more 2021-10-26
9250931 System, method, and computer program product for calculating settings for a device, utilizing one or more constraints John Spitzer, Oleg Vyacheslavovich Vinogradov 2016-02-02
9092573 System, method, and computer program product for testing device parameters John Spitzer, Oleg Vyacheslavovich Vinogradov 2015-07-28