Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5949546 | Interference apparatus for measuring absolute and differential motions of same or different testing surface | Chih-Kung Lee, Giin-Yuan Wu, Wen-Jong Wu, Chin-Fa Lee | 1999-09-07 |