Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9400307 | Test system for improving throughout or maintenance properties of semiconductor testing | Hiroshi Tamura, Takuro Nishimura | 2016-07-26 |
| 6559782 | Method of determining measuring time for an analog-digital converter | Shinichi Tanida | 2003-05-06 |