Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7535243 | Method and program for controlling an apparatus for measurement of characteristics of a semiconductor device under test | Yasushi Hashimoto | 2009-05-19 |
| 6639417 | Semiconductor parametric testing apparatus | — | 2003-10-28 |