KK

Kerwin D. Kanago

AT Agilent Technologies: 2 patents #1,067 of 3,411Top 35%
Overall (All Time): #2,198,239 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
6587671 RF test set with concurrent measurement architecture David Platt, James Summers, Melvin D. Humpherys, Richard P. Ryan, Matthew A. Johnson 2003-07-01
6512988 Fast test application switching method and system 2003-01-28