Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10088415 | Measuring probe using terahertz wave | — | 2018-10-02 |
| 9791512 | Test apparatus, test method, calibration device, and calibration method | Shin Masuda, Hideo Hara | 2017-10-17 |
| 8773141 | Test apparatus and circuit module | Shoji Kojima | 2014-07-08 |
| 8729918 | Test apparatus, circuit module and manufacturing method | Atsushi Ono | 2014-05-20 |