Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8354638 | Electron detection device and scanning electron microscope | — | 2013-01-15 |
| 5378984 | EB type IC tester | Yasuyuki Hirai | 1995-01-03 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8354638 | Electron detection device and scanning electron microscope | — | 2013-01-15 |
| 5378984 | EB type IC tester | Yasuyuki Hirai | 1995-01-03 |