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Toshio Yabe

AD Advantest: 1 patents #714 of 1,193Top 60%
Canon: 1 patents #14,899 of 19,416Top 80%
📍 Hioki, JP: #15 of 44 inventorsTop 35%
Overall (All Time): #2,090,278 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
8175738 Device manufacturing apparatus and device manufacturing method Satoshi Sugiura 2012-05-08
6111246 Semiconductor device testing apparatus having presence or absence detectors issuing an alarm when an error occurs Yutaka Watanabe, Hiroto Nakamura, Michirou Chiba 2000-08-29