TI

Toru Ibane

AD Advantest: 7 patents #131 of 1,193Top 15%
Overall (All Time): #748,500 of 4,157,543Top 20%
7
Patents All Time

Issued Patents All Time

Showing 1–7 of 7 patents

Patent #TitleCo-InventorsDate
7982485 Semiconductor test device capable of modifying an amplitude of an output signal of a driver 2011-07-19
7121132 Method for calibrating semiconductor test instruments 2006-10-17
7111490 Method for calibrating semiconductor test instruments 2006-09-26
7107816 Method for calibrating semiconductor test instruments 2006-09-19
7107815 Method for calibrating semiconductor test instruments 2006-09-19
7107817 Method for calibrating semiconductor test instruments 2006-09-19
7043959 Method for calibrating semiconductor test instrument 2006-05-16