Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11137446 | Test apparatus and test method | Shuichi Inage, Kazuhiro Iezumi, Keisuke Kusunoki, Yoshihiro KATO, Kazuhiro Tsujikawa +4 more | 2021-10-05 |
| 11057291 | Test system | Yoshiyuki Aoki, Kazuhiro Iezumi, Shuichi Inage | 2021-07-06 |