Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8547125 | Test apparatus and test module | Tadashi Morita, Takeshi Yaguchi | 2013-10-01 |
| 7728615 | Test apparatus that tests a device under test and connecting apparatus that connects a first apparatus and a second apparatus | — | 2010-06-01 |
| 5463639 | Automatic pattern synchronizing circuit of an error detector | Noboru Akiyama, Yasuto Kumai | 1995-10-31 |