TY

Takahiro Yasui

AD Advantest: 8 patents #114 of 1,193Top 10%
FC Furukawa Electric Co.: 1 patents #1,242 of 2,370Top 55%
HI Hitachi: 1 patents #17,742 of 28,497Top 65%
Overall (All Time): #508,774 of 4,157,543Top 15%
10
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9960983 Monitoring item selection method and device, and storage medium Masaki Kimura, Norihiro Hara 2018-05-01
9267965 Flexible test site synchronization Michael Jones, Alan S. Krech, Jr., Edmundo DeLaPuente, Taichi Fukuda 2016-02-23
8423840 Pattern generator 2013-04-16
8286045 Test apparatus and test method 2012-10-09
8074134 Pattern generator and memory testing device using the same 2011-12-06
7265457 Power control apparatus Hiroaki Takahashi, Hiroshi Tsutsumi, Shoji Hara 2007-09-04
6907385 Memory defect redress analysis treating method, and memory testing apparatus performing the method 2005-06-14
6711705 Method of analyzing a relief of failure cell in a memory and memory testing apparatus having a failure relief analyzer using the method 2004-03-23
6594788 Method of analyzing a relief of failure cell in a memory and memory testing apparatus having a failure relief analyzer using the method 2003-07-15
6425095 Memory testing apparatus 2002-07-23