TH

Takahiro Housako

AD Advantest: 4 patents #256 of 1,193Top 25%
📍 Gyōda, JP: #156 of 565 inventorsTop 30%
Overall (All Time): #1,261,522 of 4,157,543Top 35%
4
Patents All Time

Issued Patents All Time

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
6865698 Method and apparatus for testing semiconductor devices 2005-03-08
5796748 Pattern generator in semiconductor test system Jun Hashimoto 1998-08-18
5682390 Pattern generator in semiconductor test system Jun Hashimoto 1997-10-28
5406132 Waveform shaper for semiconductor testing devices 1995-04-11