Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7755375 | Test apparatus, probe card, and test method | Yuji Ariyama | 2010-07-13 |
| 5138267 | Method of calibrating output levels of a waveform analyzing apparatus | Masahisa Hirai | 1992-08-11 |
| 5059893 | AC evaluation equipment for an IC tester | Masahisa Hiral | 1991-10-22 |