MN

Mitsue Nanbu

AD Advantest: 2 patents #465 of 1,193Top 40%
Overall (All Time): #2,193,647 of 4,157,543Top 55%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6774620 Wafer map display apparatus and method for semiconductor test system for displaying an image of wafer and IC chips with optimum display size — 2004-08-10
6552527 Wafer map display apparatus and method for semiconductor test system — 2003-04-22