KN

Kenji Nowara

AD Advantest: 5 patents #198 of 1,193Top 20%
Overall (All Time): #1,028,050 of 4,157,543Top 25%
5
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7558327 Pattern position measuring device, method, and program, and record medium on which the program is recorded 2009-07-07
6445713 Method for measuring CDMA signal 2002-09-03
5974087 Waveform quality measuring method and apparatus 1999-10-26
5946359 Parameter measuring apparatus for digital quadrature modulation signals Shinsuke Tajiri, Juichi Nakada 1999-08-31
5799038 Method for measuring modulation parameters of digital quadrature-modulated signal Juichi Nakada 1998-08-25