| 11693049 |
Sensor test apparatus |
Daisuke Takano, Satoshi Hanamura, Michiro Chiba, Hisao Nishizaki, Atsushi Hayakawa |
2023-07-04 |
| 11614350 |
Sensor test apparatus |
Daisuke Takano, Satoshi Hanamura, Michiro Chiba, Hisao Nishizaki, Atsushi Hayakawa |
2023-03-28 |
| 11460520 |
Sensor test system |
Daisuke Takano, Satoshi Hanamura, Michiro Chiba, Hisao Nishizaki, Atsushi Hayakawa |
2022-10-04 |
| 7554350 |
Burn-in system with heating blocks accommodated in cooling blocks |
Toru Honobe, Seigo Matsunaga, Kazumi Kita |
2009-06-30 |
| 7397258 |
Burn-in system with heating blocks accommodated in cooling blocks |
Toru Honobe, Seigo Matsunaga, Kazumi Kita |
2008-07-08 |
| 6292005 |
Probe card for IC testing apparatus |
— |
2001-09-18 |
| 6184697 |
Semiconductor integrated circuit testing apparatus with reduced installation area |
— |
2001-02-06 |
| 6052284 |
Printed circuit board with electronic devices mounted thereon |
Akihiro Fujimoto |
2000-04-18 |
| 5818219 |
Semiconductor test system having test head connection apparatus |
Hiroyuki Hama |
1998-10-06 |
| 5754057 |
Contact mechanism for test head of semiconductor test system |
Hiroyuki Hama |
1998-05-19 |
| 5747994 |
Board exchange mechanism for semiconductor test system |
— |
1998-05-05 |