Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8718123 | Test apparatus and test method | Hiromi Oshima | 2014-05-06 |
| 6457148 | Apparatus for testing semiconductor device | — | 2002-09-24 |
| 6253360 | Timing generator | — | 2001-06-26 |
| 6064242 | I/O pin electronics circuit having a pair of drivers | — | 2000-05-16 |
| 5903576 | Memory test system | — | 1999-05-11 |