Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6225798 | Semiconductor device tester | Takeshi Onishi | 2001-05-01 |
| 6163146 | IC testing method | Takeshi Onishi, Hidetaka Nakazawa | 2000-12-19 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6225798 | Semiconductor device tester | Takeshi Onishi | 2001-05-01 |
| 6163146 | IC testing method | Takeshi Onishi, Hidetaka Nakazawa | 2000-12-19 |