Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7613960 | Semiconductor device test apparatus and method | Kazuyoshi Okawa, Masayuki Yoshinaga, Hajime Honda | 2009-11-03 |
| 5867435 | Fault repair method for a memory device | — | 1999-02-02 |