Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5241264 | IC test apparatus | — | 1993-08-31 |
| 5062109 | Memory tester | Hiromi Ohshima | 1991-10-29 |
| 4862071 | High speed circuit testing apparatus having plural test conditions | Kazuhiko Sato, Keiichi Takahashi | 1989-08-29 |
| 4835774 | Semiconductor memory test system | Hiromi Ooshima, Masao Shimizu | 1989-05-30 |
| 4553100 | Counter-address memory for multi-channel timing signals | — | 1985-11-12 |
| 4313200 | Logic test system permitting test pattern changes without dummy cycles | — | 1982-01-26 |