| 7728610 |
Test instrument probe with MEMS attenuator circuit |
Crispin Metzler |
2010-06-01 |
| 7504841 |
High-impedance attenuator |
Crispin Metzler |
2009-03-17 |
| 7292044 |
Integrating time measurement circuit for a channel of a test card |
— |
2007-11-06 |
| 6856158 |
Comparator circuit for semiconductor test system |
Richard W. Chrusciel |
2005-02-15 |
| 6822436 |
Universal test interface between a device under test and a test head |
— |
2004-11-23 |
| 6576301 |
Method of producing contact structure |
Theodore A. Khoury |
2003-06-10 |
| 6552528 |
Modular interface between a device under test and a test head |
— |
2003-04-22 |
| 6472890 |
Method for producing a contact structure |
Theodore A. Khoury, Mark R. Jones |
2002-10-29 |
| 6466043 |
Contact structure for electrical communication with contact targets |
Theodore A. Khoury, Mark R. Jones |
2002-10-15 |
| 6420884 |
Contact structure formed by photolithography process |
Theodore A. Khoury, Mark R. Jones |
2002-07-16 |
| 6399900 |
Contact structure formed over a groove |
Theodore A. Khoury |
2002-06-04 |
| 6297164 |
Method for producing contact structures |
Theodore A. Khoury, Mark R. Jones |
2001-10-02 |
| 6250933 |
Contact structure and production method thereof |
Theodore A. Khoury |
2001-06-26 |
| 6232669 |
Contact structure having silicon finger contactors and total stack-up structure using same |
Theodore A. Khoury |
2001-05-15 |
| 6218203 |
Method of producing a contact structure |
Theodore A. Khoury |
2001-04-17 |
| 5989994 |
Method for producing contact structures |
Theodore A. Khoury, Mark R. Jones |
1999-11-23 |