Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8145965 | Test apparatus for testing a device under test and device for receiving a signal | Kenichi Nagatani, Hiroshi Nakagawa | 2012-03-27 |
| 7808252 | Measurement apparatus and measurement method | Yuichi Miyaji | 2010-10-05 |