WC

Wei Shuo Chu

AE Advanced Semiconductor Engineering: 1 patents #625 of 1,073Top 60%
AT Ase Test: 1 patents #5 of 14Top 40%
Overall (All Time): #2,512,410 of 4,157,543Top 65%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12032001 Testing device and method for testing a device under test Jia Jin Lin, Chia-Hsiang Wang, Shih Pin Chung, You Lin Lee, Pin Heng Kuo +1 more 2024-07-09