Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11461457 | Utilizing models to generate identifiers that identify and provide authentication for machine learning models | Vikrant Kaulgud, Sanjay Podder, Adam Patten Burden | 2022-10-04 |
| 10997470 | Adversarial patches including pixel blocks for machine learning | Manish Ahuja, Samarth Sikand, Sanjay Podder | 2021-05-04 |
| 10643102 | Incident prediction and prevention | Shrikanth Narayanaswamy Chandrasekaran, Venkatesh Subramanian, Anutosh Maitra, Pradeepkumar Duraisamy, Aditya Bhola | 2020-05-05 |
| 10592398 | Generating a test script execution order | Neville Dubash, Sanjay Podder, Kishore P. Durg, Shrikanth N C | 2020-03-17 |
| 10534861 | Automated term extraction | Aditya Priyadarshi, Bhanu Anand, Bindu Madhav Tummalapalli, Bargav Jayaraman, Nisha Ramachandra +5 more | 2020-01-14 |
| 10445671 | Crowdsourcing a task | Alpana Dubey, Gurdeep Virdi, Alex Kass, Sakshi Taneja, Suma Mani Kuriakose | 2019-10-15 |
| 10438118 | Verification by metamorphic testing of applications that utilize artificial intelligence | Sanjay Podder, Neville Dubash, Kishore P. Durg, Manish Ahuja, Raghotham M. RAO +2 more | 2019-10-08 |
| 10409712 | Device based visual test automation | Neville Dubash, Sanjay Podder | 2019-09-10 |
| 10339036 | Test automation using multiple programming languages | Dipin Era, Subani Basha Nure, Neville Dubash, Sanjay Podder, Aditya Priyadarshi +1 more | 2019-07-02 |
| 10198430 | Automated functional diagram generation | Aditya Priyadarshi, Bhanu Anand, Bindu Madhav Tummalapalli, Bargav Jayaraman, Nisha Ramachandra +5 more | 2019-02-05 |
| 10152474 | Automated term extraction | Aditya Priyadarshi, Bhanu Anand, Bindu Madhav Tummalapalli, Bargav Jayaraman, Nisha Ramachandra +5 more | 2018-12-11 |
| 9460078 | Identifying glossary terms from natural language text documents | Roshni Ramesh Ramnani, Shubhashis Sengupta, Aniya Aggarwal | 2016-10-04 |
| 9262404 | System for generating test scenarios and test conditions and expected results | David E. Ingram, Brian S. Ahern, Shubhashis Sengupta, Kapil Singi, Anitha Chandran | 2016-02-16 |
| 9262308 | Test paths generation for a physical system | Aruna Jankiti | 2016-02-16 |
| 8935654 | Analysis system for test artifact generation | Shubhashis Sengupta, Roshni Ramesh Ramnani | 2015-01-13 |