Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9068823 | Height measurement by correlating intensity with position of scanning object along optical axis of a structured illumination microscope | Chun-Chieh Wang | 2015-06-30 |
| 8705043 | Height measurement by correlating intensity with position of scanning object along optical axis of a structured illumination microscope | Chun-Chieh Wang | 2014-04-22 |
| 8019136 | Optical sectioning microscopy | Jiunn-Yuan Lin | 2011-09-13 |
| 7545510 | Method of characterizing transparent thin-films using differential optical sectioning interference microscopy | Chun-Chieh Wang | 2009-06-09 |
| 5804813 | Differential confocal microscopy | Jyh Pyng Wang | 1998-09-08 |