Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9857169 | Single-step interferometric radius-of-curvature measurements utilizing short-coherence sources | James E. Millerd | 2018-01-02 |
| 7042579 | Laser monitoring using both the reflected and transmitted interference patterns of an etalon | — | 2006-05-09 |