Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11635390 | Measurement cycle determination device, measurement cycle determination program and method thereof | Tasuku Nakayama | 2023-04-25 |
| 10996048 | Image area extracting method, image area extracting program, image area extracting system, and image area extracting device | Yukio Nojiri | 2021-05-04 |
| 10955356 | Measurement cycle determination device, measurement cycle determination program and method thereof | Tasuku Nakayama | 2021-03-23 |
| 10890437 | Sheet for evaluating structure deformation | Tasuku Nakayama | 2021-01-12 |