Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12188818 | Spectrometer, metrology system, and semiconductor inspection method | Jinyong Kim | 2025-01-07 |
HY
Hidaka Yasuhiro
Overall (2025): #367,578 of 469,880Top 80%
1
Patents 2025