Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354898 | Stage, testing apparatus, and stage operating method | Hiroto Kobayashi, Hiroaki AGAWA | 2025-07-08 |
| 12259419 | Test device and probe polishing method | — | 2025-03-25 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12354898 | Stage, testing apparatus, and stage operating method | Hiroto Kobayashi, Hiroaki AGAWA | 2025-07-08 |
| 12259419 | Test device and probe polishing method | — | 2025-03-25 |