Partial year: Data through Q3 2025 (Sept 30). Full-year totals not yet available.
HK

Hironori Kasahara

OM Omron: 1 patents #119 of 361Top 35%
Overall (2025): #369,551 of 469,880Top 80%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12405232 X-ray inspection apparatus used for an inspection of a substrate, X-ray inspection system, image management method and program 2025-09-02