Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332195 | Method for calibrating parameter error of electron probe microanalysis instrument | Lihua Lei, Chengming CAO, Yingfan Xiong, Xiao DENG, Xinbin CHENG +3 more | 2025-06-17 |