Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387984 | Test structure and integrated circuit test using same | Wei-Kuan Yen, Yen-Chiang Liu, Kang-Tai Peng, Jui-Chun Weng | 2025-08-12 |
| 12347181 | Neural signal detection circuit outputting time difference data or neural data | Sen-Huang Huang, Ren-Chieh Liu, Yi-Hsien Ko, Han-Chi Liu | 2025-07-01 |