Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12210055 | Semiconductor wafer testing system and related method for improving external magnetic field wafer testing | Harry-Hak-Lay Chuang, Chih-Yang Chang, Ching-Huang Wang, Tien-Wei Chiang, Chia Yu Wang | 2025-01-28 |
| 12191262 | Package structure and method for fabricating the same | Harry-Hak-Lay Chuang, Chia-Hsiang Chen, Ching-Huang Wang, Tien-Wei Chiang | 2025-01-07 |