Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400725 | Conducting built-in self-test of memory macro | Saman M. I. Adham, Vineet Joshi, Ted Wong | 2025-08-26 |
| 12385973 | Scan architecture for interconnect testing in 3D integrated circuits | Sandeep Kumar Goel, Yun-Han Lee, Saman M. I. Adham | 2025-08-12 |