Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12412729 | Atom probe tomography specimen preparation | Shih-Wei Hung | 2025-09-09 |
| 12374522 | Detection systems in semiconductor metrology tools | Shih-Wei Hung | 2025-07-29 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12412729 | Atom probe tomography specimen preparation | Shih-Wei Hung | 2025-09-09 |
| 12374522 | Detection systems in semiconductor metrology tools | Shih-Wei Hung | 2025-07-29 |