Issued Patents 2025
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12424548 | Metallization layer and fabrication method | Huai-Ying Huang, Ruei-Cheng Shiu | 2025-09-23 |
| 12417806 | Method for programming memory | Huai-Ying Huang | 2025-09-16 |
| 12412787 | Manufacturing process with atomic level inspection | Huai-Ying Huang | 2025-09-09 |
| 12281991 | Inspection layer to improve the detection of defects through optical systems and methods of inspecting semiconductor device for defects | Huai-Ying Huang | 2025-04-22 |
| 12218014 | Method for non-destructive inspection of cell etch redeposition | Huai-Ying Huang, Yi-Chien Lee | 2025-02-04 |