Issued Patents 2025
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12399211 | Method of testing an integrated circuit and testing system | Sandeep Kumar Goel, Yun-Han Lee | 2025-08-26 |
| 12346147 | Circuit and methodology for power profile | Sandeep Kumar Goel, Yun-Han Lee | 2025-07-01 |
| 12314644 | Integrated circuit design method, system and computer program product | Sandeep Kumar Goel, Yun-Han Lee | 2025-05-27 |
| 12229483 | Method and system for reducing migration errors | Sandeep Kumar Goel, Yun-Han Lee | 2025-02-18 |