Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12332301 | Measuring device defect sensitization in transistor-level circuits | Jonti Talukdar, Shan-Fu Yuan, Huiping Huang | 2025-06-17 |
| 12271668 | Finding equivalent classes of hard defects in stacked MOSFET arrays | Michal Jerzy Rewienski, Shan-Fu Yuan, Michael Joseph Durr, Chih Ping Antony Fan | 2025-04-08 |