Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12430740 | Pattern inspection apparatus and pattern inspection method | — | 2025-09-30 |
| 12332196 | Laser light source and photoelectron microscope | Shik Shin, Toshiyuki Taniuchi, Kazuo Fujiura, Yasunori Furukawa | 2025-06-17 |