Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12306246 | Partial chain reconfiguration for test time reduction | Sandeep Jain | 2025-05-20 |
| 12265121 | Compression-based scan test system | Sandeep Jain, Prateek Singh | 2025-04-01 |
| 12203985 | Test-time optimization with few slow scan pads | Sandeep Jain, Pooja Jain | 2025-01-21 |