Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12398485 | Method of detecting crystallographic defects and method of growing an ingot | Xing Wei, Yun Liu, Xun Wang | 2025-08-26 |
| 12400917 | Method for verification of conductivity type of silicon wafer | Xing Wei, Minghao LI | 2025-08-26 |
| 12334403 | Measuring method of resistivity of a wafer | Xing Wei, Minghao LI | 2025-06-17 |